Assessing traumatic brain injury outcome measures for long-term follow-up of community-based individuals

Short Title:
Assessing traumatic brain injury outcome measures for long-term follow-up of community-based individuals
Model System:
TBI
Reference Type:
Journal Article
Accession No.:
J41677.
Journal:
Archives of Physical Medicine and Rehabilitation
Year, Volume, Issue, Page(s):
2001, vol. 82, issue 3, pp 367-374
Publication Website:
Abstract:
Study to determine which outcome measures are best and least suited for assessing long-term functional outcome of individuals with traumatic brain injury (TBI) living in the community. Participants were 48 community-dwelling adults with TBI, who completed the GOS (Glasgow Outcome Scale), DRS (Disability Rating Scale), FIM (Functional Independence Measure), FIM+FAM (Functional Assessment Measure), CIQ (Community Integration Questionnaire), R-CHART (Revised Craig Handicap Assessment and Reporting Technique), NFI (Neurobehavioral Functioning Inventory), PCRS (Patient Competency Rating Scale), SRS (Supervision Rating Scale), and LCFS (Level of Cognitive Functioning Scale) an average of five years after injury. The number of maximal scores on each measure was used to determine which instruments continued to reveal deficits years after TBI. Results indicate that the FIM, FIM+FAM, SRS, GOS, and LCFS contributed little to the assessment of functional status years after TBI. Measures that showed a range of deficits were the NFI, the PCRS, the DRS employability subscale, and the R-CHART cognition subscale. This document is included in NCDDR's Guide to Traumatic Brain Injury Resources Produced by NIDRR Grantees, number C.7.
Author(s):
Hall, K. M.; Bushnik, T.; Lakisic-Kazazic, B.; Wright, J.; Cantagallo, A.
Author Address(es):

Some items may be available for document delivery from the National Rehabilitation Information Center. Make a note of the title and any accession number and contact NARIC at 800-346-2742 to request a copy. There is a charge for document delivery from the NARIC collection.